Input/output circuit

ABSTRACT

A circuit includes a first power node having a first voltage level, and an output node. A driver transistor coupled between the first power and output nodes is turned on and off responsive to first and second input signal edge types, respectively. A driver transistor source is coupled with the first power node. A contending circuit includes a slew rate detection circuit that generates a feedback signal based on an output node signal, and a contending transistor between a driver transistor drain and a second voltage. A contending transistor gate receives a control signal based on the feedback signal. The second voltage has a level less than the first voltage level if the output node signal rises responsive to the first input signal edge type, and greater than the first voltage level if the output node signal falls responsive to the first input signal edge type.

PRIORITY CLAIM

The present application is a continuation of U.S. application Ser. No.14/630,934, filed Feb. 25, 2015, which is incorporated herein byreference in its entirety.

RELATED APPLICATION

The instant application is related to U.S. application Ser. No.14/189,653, filed Feb. 25, 2014, now U.S. Pat. No. 9,214,933, issuedDec. 15, 2015. The entire contents of the above-referenced applicationare incorporated by reference herein.

BACKGROUND

As semiconductor technology develops, an integrated circuit sometimeshas a signal operating at a voltage swing lower than that of a signalsuitable for an external circuit, such as another integrated circuit orone or more discrete electrical components. An input/output (I/O)circuit is often used in the integrated circuit in order to convert thelow voltage swing signal from the integrated circuit to a high voltageswing signal recognizable by the external circuit. In some applications,the integrated circuit includes low voltage transistors and high voltagetransistors. Low voltage transistors are sometimes also referred to ascore (or thin-gate) transistors and are configured to handle the lowvoltage swing signal. High voltage transistors are sometimes alsoreferred to as I/O (or thick-gate) devices and are configured to handlethe large voltage swing signal. Core transistors are designed to besufficiently large to handle the low voltage swing signal, but areusually not large enough to handle the large voltage swing signal. Onthe other hand, compared with low-voltage transistors, I/O transistorsare usually larger and occupy a larger die space.

BRIEF DESCRIPTION OF THE DRAWINGS

Aspects of the present disclosure are best understood from the followingdetailed description when read with the accompanying figures. It isnoted that, in accordance with the standard practice in the industry,various features are not drawn to scale. In fact, the dimensions of thevarious features may be arbitrarily increased or reduced for clarity ofdiscussion.

FIG. 1 is a circuit diagram of an example I/O circuit in accordance withsome embodiments.

FIGS. 2A and 2B are timing diagrams of voltage signals at various nodesof the I/O circuit of FIG. 1 in accordance with some embodiments.

FIG. 3A is a circuit diagram of an example control circuit usable in theI/O circuit of FIG. 1 in accordance with some embodiments.

FIG. 3B is a timing diagram of the control circuit of FIG. 3A inaccordance with some embodiments.

FIG. 4A is a circuit diagram of an example control circuit usable in theI/O circuit of FIG. 1 in accordance with some embodiments.

FIG. 4B is a timing diagram of the control circuit of FIG. 4A inaccordance with some embodiments.

FIG. 5A is a circuit diagram of an example control circuit usable in theI/O circuit of FIG. 1 in accordance with some embodiments.

FIG. 5B is a timing diagram the control circuit of FIG. 5A in accordancewith some embodiments.

FIG. 6 is a circuit diagram of an example I/O circuit in accordance withsome embodiments.

FIG. 7 is a circuit diagram of an example I/O circuit in accordance withsome embodiments.

FIG. 8 is a flow chart of a method of operating an I/O circuit inaccordance with some embodiments.

DETAILED DESCRIPTION

The following disclosure provides many different embodiments, orexamples, for implementing different features of the invention. Specificexamples of components and arrangements are described below to simplifythe present disclosure. These are, of course, merely examples and arenot intended to be limiting. For example, the formation of a firstfeature over or on a second feature in the description that follows mayinclude embodiments in which the first and second features are formed indirect contact, and may also include embodiments in which additionalfeatures may be formed between the first and second features, such thatthe first and second features may not be in direct contact. In addition,the present disclosure may repeat reference numerals and/or letters inthe various examples. This repetition is for the purpose of simplicityand clarity and does not in itself dictate a relationship between thevarious embodiments and/or configurations discussed.

Further, spatially relative terms, such as “beneath,” “below,” “lower,”“above,” “upper” and the like, may be used herein for ease ofdescription to describe one element or feature's relationship to anotherelement(s) or feature(s) as illustrated in the figures. The spatiallyrelative terms are intended to encompass different orientations of thedevice in use or operation in addition to the orientation depicted inthe figures. The apparatus may be otherwise oriented (rotated 90 degreesor at other orientations) and the spatially relative descriptors usedherein may likewise be interpreted accordingly.

In accordance with one or more embodiments, an I/O circuit includespull-up cascode driver transistors, pull-down cascode drivertransistors, and one or more contending circuits. The contendingcircuits are usable to prevent a voltage stress applied to the pull-upcascode driver transistors or the pull-down cascode driver transistorswhen the I/O circuit is used to drive a large load.

FIG. 1 is a circuit diagram of an example I/O circuit 100 in accordancewith some embodiments. I/O circuit 100 includes an input node 102 and anoutput node 104. Circuit 100 is configured to receive an input signalV_(IN) at input node 102 and to generate an output signal V_(OUT) atoutput node 104. Input signal V_(IN) has a voltage level ranging from azero reference level (i.e., 0 volt for circuit 100) to a predeterminedvoltage level V_(DD). Output signal V_(OUT) has a voltage level rangingfrom the zero reference level to a predetermined voltage level K·V_(DD).K is a positive ratio greater than 1. V_(DD) is a predetermined,non-zero value above the zero reference level. In some embodiments,V_(DD) ranges from 0.65 Volts (V) to 1.20 V. Input signal V_(IN) is alogic signal usable to indicate a logic low value when input signalV_(IN) is set at the zero reference level and to indicate a logic highvalue when input signal V_(IN) is set at V_(DD). Output signal V_(OUT)is a logic signal usable to indicate a logic high value (K·V_(DD)) wheninput signal V_(IN) is set at the zero reference level and to indicate alogic low value (the zero reference level) when input signal V_(IN) isset at V_(DD). In FIG. 1, output signal V_(OUT) is logicallycomplementary to input signal V_(IN), in some embodiments, andtime-shifted by a time delay attributable to the operation of I/Ocircuit 100.

I/O circuit 100 includes a first power node 112, a second power node114, a third power node 116, and a fourth power node 118. I/O circuit100 also includes a first pull-up driver transistor 122 and a secondpull-up driver transistor 124 coupled in series between power node 112and output node 104; a first pull-down driver transistor 132 and asecond pull-down driver transistor 134 coupled in series between powernode 114 and output node 104; a biasing circuit 140 configured tocontrol the pull-up driver transistors 122 and 124 and the pull-downdriver transistors 132 and 134 based on input signal V_(IN); andcontending circuits 150 and 160 configured to contend with drivertransistors 122 or 132 under certain operation conditions. Output node104 of I/O circuit 100 is coupled with an internal load 182, includingat least an I/O pad and an electrostatic discharge (ESD) protectioncircuit, and an external load 184. Internal load 182 and external load184 are collectively represented by a capacitive load 180 in thisapplication.

Driver transistor 122 is a P-type transistor having a source coupledwith power node 112. Driver transistor 124 is a P-type transistor havinga source coupled with a drain of driver transistor 122 and a draincoupled with output node 104. The node corresponding to the source ofthe driver transistor 124 and the drain of the driver transistor 122 islabeled as node 126. Driver transistors 122 and 124 are also known ascascode transistors. Driver transistor 132 is an N-type transistorhaving a source coupled with power node 114. Driver transistor 134 is anN-type transistor having a source coupled with a drain of drivertransistor 132 and a drain coupled with output node 104. The nodecorresponding to the source of the driver transistor 134 and the drainof the driver transistor 132 is labeled as node 136. Driver transistors132 and 134 are also known as cascode transistors.

Biasing circuit 140 is coupled with input node 102 and gates of drivertransistors 122, 124, 132, and 134. Biasing circuit 140 is configured toturn off driver transistors 122 and 124 and turn on driver transistors132 and 134 responsive to input signal V_(IN) being at the logical highvalue; and to turn on driver transistors 122 and 124 and turn off drivertransistors 132 and 134 responsive to input signal V_(IN) being at thelogical low value. In some embodiments when K is 2, the voltage level atthe gates of driver transistors 124 and 134 are set at V_(DD). Biasingcircuit 140 also includes a level shifter 142 and a delay unit 144between input node 102 and the gate of driver transistor 122, and adelay unit 146 between input node 102 and the gate of driver transistor132. Level shifter 142 is configured to generate an intermediate signalV_(INT) by up-shifting input signal V_(IN) by V_(DD). Delay unit 144 isconfigured to generate the signal to be fed to the gate of drivertransistor 122 by delaying the intermediate signal V_(INT). Delay unit146 is configured to generate the signal to be fed to the gate of drivertransistor 132 by delaying the input signal V_(IN).

Delay units 144 and 146 are usable to synchronize the timing oftransitions of the bias voltage for the gates of driver transistors 122and 132. In some embodiments, the delay periods of delay units 144 and146 are tunable according to one or more control signals, either in ananalog or digital format. In some embodiments, the delay periods ofdelay units 144 and 146 are predetermined and fixed when delay units 144and 146 are fabricated.

In some applications, the capacitive load 180 causes the output signalV_(OUT) to have a slew rate slower than the slew rate of the signal atthe gate of driver transistor 122 or the slew rate of the signal at thegate of driver transistor 132. Therefore, in some occasions, when drivertransistor 122 is turned on, a voltage difference between node 126 andoutput signal V_(OUT) is greater than V_(DD). Also, in some occasions,when driver transistor 132 is turned on, a voltage difference betweennode 136 and output signal V_(OUT) is greater than V_(DD). However, insome applications, driver transistors 124 and 134 are not designed torepetitively withstand a source-to-drain voltage greater than V_(DD).The issue caused by voltage over-stress to driver transistors 124 and134 are also known as a “hot-carrier-injection” issue. In someapplications, the “hot-carrier-injection” issue causes degradation ofthe reliability of I/O circuit 100 when the slew rate of the outputsignal V_(OUT) is greater than 10 ns.

Contending circuit 150 is configured to pull the drain of drivertransistor 122 toward a third voltage level at third power node 116during a time period after the driver transistor 122 is set to pull thedrain of the driver transistor 122 toward the first voltage level atthird power node 116. The time period is determined based on a slew rateof output signal V_(OUT), and the third voltage level is less than thefirst voltage level. As a result, a source-to-drain voltage of drivertransistor 124 when driver transistor 122 is turned on is mitigated bycontending circuit 150. In some embodiments, a voltage differencebetween the first voltage level and the third voltage level is equal toor less than V_(DD). In some embodiments, the first voltage level is2·V_(DD), and the third voltage level is V_(DD).

Contending circuit 150 includes a slew rate detection circuit 152configured to generate a feedback signal V_(SRP) based on a rising edgeof output signal V_(OUT), a control circuit 154 configured to generate acontrol signal V_(CDP) based on a signal V_(INP) at the gate of drivertransistor 122 and feedback signal V_(SRP), and a contending transistor156 between the drain of the driver transistor 122 (i.e., node 126) andthird voltage node 116. Contending transistor is an N-type transistor inthe embodiment depicted in FIG. 1 and has a gate configured to receivethe control signal V_(CDP). In some embodiments, contending transistor156 has a driving capability equal to or less than driver transistor122.

Contending circuit 160 includes a slew rate detection circuit 162configured to generate a feedback signal V_(SRN) based on a falling edgeof output signal V_(OUT), a control circuit 164 configured to generate acontrol signal V_(CDN) based on a signal V_(INN) at the gate of drivertransistor 132 and feedback signal V_(SRN), and a contending transistor166 between the drain of the driver transistor 132 (i.e., node 136) andfourth voltage node 118. Contending transistor is a P-type transistor inthe embodiment depicted in FIG. 1 and has a gate configured to receivethe control signal V_(CDN). In some embodiments, contending transistor166 has a driving capability equal to or less than driver transistor132.

In some embodiments, one of the contending circuit 150 or contendingcircuit 160 is omitted. In some embodiments, slew rate detection circuit152 and slew rate detection circuit 162 are implemented as an integratedslew rate detection circuit.

FIG. 2A is a timing diagram of voltage signals at various nodes of theI/O circuit 100 when input signal V_(IN) transitions from the logicallow value to the logical high value in accordance with some embodiments.FIG. 2A is illustrated in conjunction with some components depicted inFIG. 1 and the reference numbers assigned thereof.

In FIG. 2A, curve 212 represents signal V_(INN) at the gate of drivertransistor 132; curve 214 represents signal V_(CDN) at the gate ofcontending transistor 166; curve 222 represents a signal V_(DN) at drainof driver transistor 132; and curve 224 represents signal V_(OUT) atoutput node 104. Curve 232 represents the voltage difference betweensignal V_(OUT) and signal V_(DN).

Moreover, curve 222′ represents a signal V_(DN) at drain of drivertransistor 132 in an alternative I/O circuit having a configurationwithout contending circuit 160; curve 224′ represents signal V_(OUT) atoutput node 104 in such alternative I/O circuit; and curve 232′represents the voltage difference between signal V_(OUT) and signalV_(DN) in this alternative I/O circuit.

At time T₂₁₁, biasing circuit causes signal V_(INN) (curve 212) totransit from the zero reference level to voltage V_(DD) (which is set tobe 1.8 V in this embodiment). At time T_(212,) the voltage level ofsignal V_(INN) (curve 212) starts to turn on driver transistor 132. As aresult, output signal V_(OUT) (curve 224) starts to transition from2·V_(DD) (which is set to be 3.6 V in this embodiment) to the zeroreference level. A slew rate of the falling edge of output signalV_(OUT) depends on the driving capability of driver transistors 132 and134 and the capacitive load 180. Based on a slew rate of the fallingedge of output signal V_(OUT) (curve 224) detected by slew ratedetection circuit 162, control circuit 164 keeps signal V_(CDN) (curve214) at the zero reference level for the time being. Therefore,contending transistor 166 is turned on responsive to signal V_(CDN), andsignal V_(DN) (curve 222) remains at a voltage level close to V_(DD) asa result of current contention between contending transistor 166 anddriver transistor 132.

At time T₂₁₃, the voltage level of signal V_(INN) (curve 212) reachesV_(DD). At time T₂₁₄, based on a slew rate of the falling edge of outputsignal V_(OUT) (curve 224) detected by slew rate detection circuit 162,control circuit 164 causes signal V_(CDN) (curve 214) to transition fromthe zero reference level to V_(DD). The rising edge of signal V_(CDN) isgenerated by delaying the rising edge of signal V_(INN) for a delayperiod T_(D1), where the delay period T_(D1) is determined by controlcircuit 164 based on the feedback signal V_(SRN) from slew ratedetection circuit 162. The voltage level of signal V_(CDN) (curve 214)starts to turn off contending transistor 166. As contending transistor166 is being gradually turned off by signal V_(CDN,) signal V_(DN)(curve 222) starts to transition toward the zero reference level bydriver transistor 132.

At time T₂₁₅, the voltage level of signal V_(CDN) (curve 212) reachesV_(DD), contending transistor 166 is fully turned off, and the voltagelevel of signal V_(DN) (curve 222) has reached about 0.1·V_(DD) abovethe zero reference level. At time T₂₁₆, the voltage level of outputsignal V_(OUT) (curve 224) reaches the zero reference level.

As illustrated by curve 232, a voltage difference between output signalV_(OUT) and signal V_(DN) is controlled to be less than or equal toV_(DD).

In comparison with the embodiment described in conjunction with curves212, 214, 222, 224 and 232, the operation of the alternative I/O circuithaving a configuration without contending circuit 160 is illustrated inconjunction with curves 212, 222′, 224′, and 232′. Responsive to therising edge of signal V_(INN) (curve 212), signal V_(DN) (curve 222′)begins to transition from V_(DD) to the zero reference level at timeT₂₁₂. The voltage level of signal V_(DN) (curve 222′) reaches about0.1·V_(DD) above the zero reference level at time T₂₁₃. Output signalV_(OUT) (curve 224′) begins to transition from 2·V_(DD) to the zeroreference level at time T₂₁₂ and reaches the zero reference level rightafter time T₂₁₅. In the alternative I/O circuit, a voltage differencebetween output signal V_(OUT) and signal V_(DN) exceeds V_(DD) at timeT₂₁₂ and is not pulled back to be under V_(DD) until about the half waybetween time T₂₁₃ and time T₂₁₄.

Comparing curves 224 and 224′, it takes longer for the output signalV_(OUT) of the I/O circuit with contending circuit 160 to transitionfrom 2·V_(DD) to the zero reference level responsive to the rising edgeof signal V_(INN) than the alternative I/O circuit without contendingcircuit 160. In some embodiments, contending circuit 160 is configuredto keep the responsive speed of output signal V_(OUT) within apredetermined design specification. However, comparing curves 232 and232′, the I/O circuit with contending circuit 160 has a much lower riskto stress or damage driver transistor 134 than the alternative I/Ocircuit without contending circuit 160.

FIG. 2B is a timing diagram of voltage signals at various nodes of theI/O circuit 100 when input signal V_(IN) transitions from the logicalhigh value to the logical low value in accordance with some embodiments.FIG. 2B is illustrated in conjunction with some components depicted inFIG. 1 and the reference numbers assigned thereof.

In FIG. 2B, curve 252 represents signal V_(INP) at the gate of drivertransistor 122; curve 254 represents signal V_(CDP) at gate ofcontending transistor 156; curve 262 represents a signal V_(DP) at drainof driver transistor 122; and curve 264 represents signal V_(OUT) atoutput node 104. Curve 272 represents the voltage difference betweensignal V_(DP) and signal V_(OUT).

Moreover, curve 262′ represents a signal V_(DP) at drain of drivertransistor 122 in an alternative I/O circuit having a configurationwithout contending circuit 150; curve 264′ represents signal V_(OUT) atoutput node 104 in such alternative I/O circuit; and curve 272′represents the voltage difference between signal V_(DP) and signalV_(OUT) in this alternative I/O circuit.

At time T₂₂₁, biasing circuit causes signal V_(INP) (curve 252) totransition from 2·V_(DD) to V_(DD). At time T₂₂₂, the voltage level ofsignal V_(INP) (curve 252) starts to turn on driver transistor 122 andoutput signal V_(OUT) (curve 254) thus starts to transition from thezero reference level to 2·V_(DD). A slew rate of the rising edge ofoutput signal V_(OUT) depends on the driving capability of drivertransistors 122 and 124 and the capacitive load 180. Based on a slewrate of the rising edge of output signal V_(OUT) (curve 264) detected byslew rate detection circuit 152, control circuit 154 keeps signalV_(CDP) (curve 254) at 2·V_(DD) for the time being. Therefore,contending transistor 156 is turned on responsive to signal V_(CDP), andsignal V_(DP) (curve 262) remains at a voltage level close to V_(DD) asa result of current contention between contending transistor 156 anddriver transistor 122.

At time T₂₂₃, the voltage level of signal V_(INP) (curve 252) reachesV_(DD). At time T₂₂₄, based on a slew rate of the rising edge of outputsignal V_(OUT) (curve 264) detected by slew rate detection circuit 152,control circuit 154 causes signal V_(CDP) (curve 254) to transition from2·V_(DD) to V_(DD). The falling edge of signal V_(CDP) is generated bydelaying the falling edge of signal V_(INP) for a delay period T_(D2),where the delay period T_(D2) is determined by control circuit 154 basedon the feedback signal V_(SRP) from slew rate detection circuit 152. Thevoltage level of signal V_(CDP) (curve 254) starts to turn offcontending transistor 156. As contending transistor 156 is beinggradually turned off by signal V_(CDP,) signal V_(DP) (curve 262) startsto transition toward 2·V_(DD) by driver transistor 122.

At time T₂₂₅, the voltage level of signal V_(CDP) (curve 254) reachesV_(DD), contending transistor 156 is fully turned off, and the voltagelevel of signal V_(DP) (curve 262) has reached about 0.1·V_(DD) below2·V_(DD). At time T₂₂₆, the voltage level of output signal V_(OUT)(curve 264) reaches 2·V_(DD).

As illustrated by curve 272, a voltage difference between signal V_(DP)and output signal V_(OuT) is controlled to be no greater than V_(DD).

Similar to the comparison between an I/O circuit with contending circuit160 and an I/O circuit without contending circuit 160 depicted in FIG.2A, responsive to the falling edge of signal V_(INP) (curve 252), signalV_(DP) (curve 262′) begins to transition from V_(DD) to 2·V_(DD) at timeT₂₂₂. The voltage level of signal V_(DP) (curve 262′) reaches about0.1·V_(DD) below 2·V_(DD) at time T₂₂₃. Output signal V_(OUT) (curve264′) begins to transition from the zero reference level to 2·V_(DD) attime T₂₂₂ and reaches 2·V_(DD) right after time T₂₂₅. In the alternativeI/O circuit, a voltage difference between signal V_(DP) and outputsignal V_(OUT) exceeds V_(DD) at time T₂₂₂ and is not pulled back to beunder V_(DD) until about the half way between time T₂₂₃ and time T₂₂₄.

FIG. 3A is a circuit diagram of an example control circuit 300 usable ascontrol circuit 164 in the I/O circuit 100 of FIG. 1 in accordance withsome embodiments. Components that are the same or similar to thosedepicted in FIG. 1 are given the same reference numbers, and detaileddescription thereof is thus omitted.

Control circuit 300 includes a first power node 302 and a second powernode 304. In some embodiments, power node 302 is configured to receive avoltage having the voltage level the same as that of power node 118(FIG. 1, V_(DD)), and power node 304 is configured to receive a voltagehaving the voltage level the same as that of power node 114 (the zeroreference level). Components of control circuit 300 are operated in apower domain defined by power node 302 and power node 304.

Control circuit 300 includes an adjustable delay circuit 312 and an ANDgate 314. Adjustable delay circuit 312 has an input node 312 aconfigured to receive signal V_(INN) and an output node 312 b.Adjustable delay circuit 312 is configured to generate a delayed signalV_(INN)′ by delaying the signal V_(INN) based on the feedback signalV_(SRN). In some embodiments, when the output signal V_(OUT) has aslower slew rate, adjustable delay circuit 312 is set to have a greaterdelay.

AND gate 314 having a first input 314 a, a second input 314 b, and anoutput 314 c. First input 314 a of the AND gate 314 is configured toreceive the signal V_(INN), and second input 314 b of the AND gate 314is configured to receive the delayed signal V_(INN)′ from the adjustabledelay circuit 312. Output 314 c of the AND gate 314 is coupled with, andconfigured to provide control signal V_(CDN) to, the gate of thecontention transistor 166.

FIG. 3B is a timing diagram of the control circuit of FIG. 3A inaccordance with some embodiments. Curve 322 represents signal V_(INN);curve 324 represents signal V_(INN)′; and curve 326 represents signalV_(CDN). As depicted in FIGS. 3A and 3B, delay circuit 312 generates therising edge of delayed signal V_(INN)′ by delaying the correspondingrising edge of signal V_(INN) for a time delay T_(D1). Time delay T_(D1)is set based on the feedback signal V_(SRN). Also, AND gate 314generates a rising edge of signal V_(CDN) by passing though thecorresponding rising edge of signal V_(INN)′ and generates a fallingedge of signal V_(CDN) by passing though the corresponding falling edgeof signal V_(INN). By passing along the falling edge of signal V_(INN)to signal V_(CDN), the voltage level at node 136 (i.e., signal V_(DN))is at least controlled by either driver transistor 132 or contentiontransistor 166 when signal V_(IN) transitions from logical high value tological low value.

FIG. 4A is a circuit diagram of another example control circuit 400usable as control circuit 154 in the I/O circuit of FIG. 1 in accordancewith some embodiments. Components that are the same or similar to thosedepicted in FIG. 1 are given the same reference numbers, and detaileddescription thereof is thus omitted.

Control circuit 400 includes a first power node 402 and a second powernode 404. In some embodiments, power node 402 is configured to receive avoltage having the voltage level the same as that of power node 112(FIG. 1, 2·V_(DD)), and power node 404 is configured to receive avoltage having the voltage level the same as that of power node 116(V_(DD)). Components of control circuit 400 are operated in a powerdomain defined by power node 402 and power node 404.

Control circuit 400 includes an adjustable delay circuit 412 and an ORgate 414. Adjustable delay circuit 412 has an input node 412 aconfigured to receive signal V_(INP) and an output node 412 b.Adjustable delay circuit 412 is configured to generate a delayed signalV_(INP)′ by delaying the signal V_(INP) based on the feedback signalV_(SRP). In some embodiments, when the output signal V_(OUT) has aslower slew rate, adjustable delay circuit 412 is set to have a greaterdelay.

OR gate 414 having a first input 414 a, a second input 414 b, and anoutput 414 c. First input 414 a of the OR gate 414 is configured toreceive the signal V_(INP), and second input 414 b of the OR gate 414 isconfigured to receive the delayed signal V_(INP)′ from the adjustabledelay circuit 412. Output 414 c of the OR gate 414 is coupled with, andconfigured to provide control signal V_(CDP) to, the gate of thecontending transistor 156.

FIG. 4B is a timing diagram the control circuit of FIG. 4A in accordancewith some embodiments. Curve 422 represents signal V_(INP); curve 424represents signal V_(INP)′; and curve 426 represents signal V_(CDP). Asdepicted in FIGS. 4A and 4B, delay circuit 412 generates the fallingedge of delayed signal V_(INP)′ by delaying the corresponding fallingedge of signal V_(INP) for a time delay T_(D2). Time delay T_(D2) is setbased on the feedback signal V_(SRP). Also, OR gate 414 generates afalling edge of signal V_(CDP) by passing though the correspondingfalling edge of signal V_(INP)′ and generates a rising edge of signalV_(CDP) by passing though the corresponding rising edge of signalV_(INP). By passing along the rising edge of signal V_(INP) to signalV_(CDP), the voltage level at node 126 (i.e., signal V_(DP)) is at leastcontrolled by either driver transistor 122 or contention transistor 156when signal V_(IN) transitions from logical low value to logical highvalue.

FIG. 5A is a circuit diagram of another example control circuit 500usable as control circuit 154 or control circuit 164 in the I/O circuitof FIG. 1 in accordance with some embodiments. Components that are thesame or similar to those depicted in FIG. 1 are given the same referencenumbers, and detailed description thereof is thus omitted.

Control circuit 500 includes a first power node 502 and a second powernode 504. Components of control circuit 500 are operated in a powerdomain defined by power node 502 and power node 504.

In some embodiments when control circuit 500 is used as control circuit154, power node 502 is configured to receive a voltage having thevoltage level the same as that of power node 112 (FIG. 1, 2·V_(DD)), andpower node 504 is configured to receive a voltage having the voltagelevel the same as that of power node 116 (V_(DD)). In some embodimentswhen control circuit 500 is used as control circuit 164, power node 502is configured to receive a voltage having the voltage level the same asthat of power node 118 (FIG. 1, V_(DD)), and power node 504 isconfigured to receive a voltage having the voltage level the same asthat of power node 114 (the zero reference level).

Control circuit 500 includes an adjustable delay circuit configured togenerate control signal V_(CDP) or V_(CDN) by delaying the correspondingsignal V_(INP) or V_(INN) based on the feedback signal V_(SRP) orV_(SRN). In some embodiments, when the output signal V_(OUT) has aslower slew rate, adjustable delay circuit 512 is set to have a greaterdelay.

FIG. 5B is a timing diagram the control circuit of FIG. 5A in accordancewith some embodiments. Curve 522 represents signal V_(INN) and curve 524represents signal V_(CDN) when control circuit 500 is used as controlcircuit 164. Curve 526 represents signal V_(INP) and curve 528represents signal V_(CDP) when control circuit 500 is used as controlcircuit 154.

As depicted in FIGS. 5A and 5B, when control circuit 500 is used ascontrol circuit 164, control circuit 500 generates the rising edge ofsignal V_(CDN) by delaying the corresponding rising edge of signalV_(INN) for a time delay T_(D1) and generates the falling edge of signalV_(CDN) by delaying the corresponding falling edge of signal V_(INN) fora time delay T_(D3). Time delays T_(D1) and T_(D3) are set based on thefeedback signal V_(SRN). Compared with using control circuit 300, bothdriver transistor 132 and contention transistor 166 are turned offduring the time period T_(D3), and thus node 136 is temporarily set tobe electrically floating.

Moreover, when control circuit 500 is used as control circuit 154,control circuit 500 generates the falling edge of signal V_(CDP) bydelaying the corresponding falling edge of signal V_(INP) for a timedelay T_(D2) and generates the rising edge of signal V_(CDP) by delayingthe corresponding rising edge of signal V_(INP) for a time delay T_(D4).Time delays T_(D2) and T_(D4) are set based on the feedback signalV_(SRP). Compared with using control circuit 400, both driver transistor122 and contention transistor 156 are turned off during the time periodT_(D4), and thus node 126 is temporarily set to be electricallyfloating.

FIG. 6 is a circuit diagram of another example I/O circuit 600 inaccordance with some embodiments. Components that are the same orsimilar to those depicted in FIG. 1 are given the same referencenumbers, and detailed description thereof is thus omitted.

Compared with I/O circuit 100, circuit 600 further includes a P-typedriver transistor 622 between output node 104 and driver transistor 124;an N-type driver transistor 632 between output node 104 and drivertransistor 134; and a biasing circuit 640 replacing biasing circuit 140.Output signal V_(OUT) has a voltage level ranging from the zeroreference level to a predetermined voltage level 3·V_(DD). Power node112 is configured to receive a voltage having a voltage level of3·V_(DD). Power node 116 is configured to receive a voltage having avoltage level of 2·V_(DD).

Biasing circuit 640 is coupled with input node 102 and gates of drivertransistors 122, 124, 622, 132, 134, and 632. Biasing circuit 640 isconfigured to turn off driver transistors 122, 124, and 622 and turn ondriver transistors 132, 134, and 632 responsive to input signal V_(IN)being at the logical high value; and to turn on driver transistors 122,124, and 622 and turn off driver transistors 132, 134, and 632responsive to input signal V_(IN) being at the logical low value. Insome embodiments, biasing circuit 640 outputs an up-shifted signalranging from 2·V_(DD) to 3·V_(DD) to the gate of driver transistor 122;an up-shifted, inverted, signal ranging from 2·V_(DD) to V_(DD) to thegates of driver transistor 622 and 632; and a signal ranging from 0 toV_(DD) to the gate of driver transistor 132. In some embodiments,biasing circuit 640 outputs 2·V_(DD) to the gate of driver transistor124 and V_(DD) to the gate of driver transistor 134.

The operation of contending circuits 150 and 160 in I/O circuit 600 aresimilar to the operation of contending circuits 150 and 160 in I/Ocircuit 100, and detailed description is thus omitted.

FIG. 7 is a circuit diagram of another example I/O circuit 700 inaccordance with some embodiments. Components that are the same orsimilar to those depicted in FIG. 1 are given the same referencenumbers, and detailed description thereof is thus omitted.

Compared with I/O circuit 100, circuit 700 includes K P-type cascodedriver transistors 720[1], 720[2], 720[3], . . . , 720[K] coupled inseries between power node 112 and output node 104; K N-type cascodedriver transistors 730[1], 730[2], 730[3], . . . , 730[K] coupled inseries between power node 114 and output node 104; and a biasing circuit740 replacing biasing circuit 140. Output signal V_(OUT) has a voltagelevel ranging from the zero reference level to a predetermined voltagelevel K·V_(DD). Power node 112 is configured to receive a voltage havinga voltage level of K·V_(DD). Power node 116 is configured to receive avoltage having a voltage level of (K−1)·V_(DD). K is a positive rationgreater than 1. In some embodiments when K is set to be 2, circuit 700becomes the same as I/O circuit 100, where driver transistor 720[1]corresponds to driver transistor 122; driver transistor 720[2]corresponds to driver transistor 124; driver transistor 730[1]corresponds to driver transistor 132; and driver transistor 730[2]corresponds to driver transistor 134.

Biasing circuit 740 is coupled with input node 102 and gates of drivertransistors 720[1], 720[2], 720[3], . . . , 720[K], 730[1], 730[2],730[3], . . . , and 730[K]. Biasing circuit 740 is configured to turnoff driver transistors 720 and turn on driver transistors 730 responsiveto input signal V_(IN) being at the logical high value; and to turn ondriver transistors 720 and turn off driver transistors 730 responsive toinput signal V_(IN) being at the logical low value. The operation ofcontending circuits 150 and 160 in I/O circuit 700 are similar to theoperation of contending circuits 150 and 160 in I/O circuit 100, anddetailed description is thus omitted.

FIG. 8 is a flow chart of a method 800 of operating an I/O circuit inaccordance with some embodiments. To facilitate the explanation ofmethod 800, I/O circuit 100 is referred to as an example. However,method 800 is also applicable to I/O circuit 600 or 700. It isunderstood that additional operations may be performed before, during,and/or after the method 800 depicted in FIG. 8, and that some otherprocesses may only be briefly described herein.

As depicted in FIG. 8 and FIG. 1, the process 800 begins with operation810, where an output node is electrically coupled with a power nodethrough a driver transistor responsive to an edge of an input signal.For example, if input signal V_(IN) transitions from the zero referencelevel to V_(DD), output node 104 is electrically coupled with power node114 through driver transistor 132. Also, if input signal V_(IN)transitions from V_(DD) to the zero reference level, output node 104 iselectrically coupled with power node 112 through driver transistor 122.

The process 800 proceeds to operation 820, where a control signalV_(CDP) or V_(CDN) is generated based on a signal V_(INP) or V_(INN) ata gate of the driver transistor 122 or 132 and a slew rate of a signalV_(OUT) at the output node 104.

Operation 820 includes operation 822 and operation 824. In operation822, a falling edge of signal V_(CDP) is generated by delaying acorresponding falling edge of signal V_(INP) for a delay period T_(D2),and the delay period T_(D2) is determined based on the slew rate of arising edge of signal V_(OUT). Also, in operation 822, a rising edge ofsignal V_(CDN) is generated by delaying a corresponding rising edge ofsignal V_(INN) for a delay period T_(D1), and the delay period T_(D1) isdetermined based on the slew rate of a falling edge of signal V_(OUT).

In operation 824, when control circuit 400 in FIG. 4 is being used, arising edge of signal V_(CDP) is generated by passing through acorresponding rising edge of signal V_(INP), and thus avoiding furtherdelaying rising edge of signal V_(CDP) as compared with thecorresponding rising edge of signal V_(INP). Also, in operation 824,when control circuit 300 in FIG. 3 is being used, a falling edge ofsignal V_(CDN) is generated by passing through a corresponding fallingedge of signal V_(INN), and thus avoiding further delaying falling edgeof signal V_(CDN) as compared with the corresponding falling edge ofsignal V_(INN).

In some embodiments when control circuit 500 in FIG. 5 is being usedinstead of control circuit 300 and control circuit 400, operation 824 isomitted.

The process 800 proceeds to operation 830, where a contending circuit iscaused to contend with the driver transistor by electrically coupling adrain of the driver transistor with another power node through thecontending circuit responsive to the control signal. For example, whendriver transistor 122 is turned on to pull signal V_(DP) toward K·V_(DD)at power node 112, control signal V_(CDP) causes contending transistor156 to pull signal V_(DP) toward (K−1)·V_(DD) during the delay periodT_(D2). Also, when driver transistor 132 turned on to pull signal V_(DN)toward the zero reference level at power node 114, control signalV_(CDN) causes contending transistor 166 to pull signal V_(DN) towardV_(DD) during the delay period T_(D1).

In some embodiments, a circuit includes a first power node configured tocarry a first voltage having a first voltage level, an output node, anda driver transistor coupled between the first power node and the outputnode. The driver transistor is configured to be turned on responsive toan edge of a first type of an input signal and to be turned offresponsive to an edge of a second type of the input signal. The drivertransistor has a source, a drain, and a gate, the source of the drivertransistor being coupled with the first power node. A contending circuitcomprises a slew rate detection circuit configured to generate afeedback signal based on a signal at the output node, and a contendingtransistor between the drain of the driver transistor and a secondvoltage, the contending transistor having a gate configured to receive acontrol signal based on the feedback signal. The second voltage has asecond voltage level, the second voltage level being less than the firstvoltage level if the signal at the output node rises responsive to theedge of the first type of the input signal, and the second voltage levelbeing greater than the first voltage level if the signal at the outputnode falls responsive to the edge of the first type of the input signal.

In some embodiments, a circuit, comprises a first power node configuredto carry a first power voltage, a second power node configured to carrya second power voltage, an output node configured to carry an outputvoltage, and a driver transistor coupled between the output node andeither the first power node or the second power node, the drivertransistor comprising a source, a drain, and a gate, the drain beingcoupled with the output node. A biasing circuit is configured to controlthe driver transistor based on an input signal having a voltage levelranging from a zero reference level to a predetermined voltage levelgreater than the zero reference level, and a contending circuit isconfigured to control a voltage at the source of the driver transistor,wherein a magnitude of a difference between the output voltage and thevoltage at the source of the driver transistor is controlled to be lessthan or equal to the predetermined voltage level.

In some embodiments, a method includes electrically coupling an outputnode of a circuit with a first power node through a driver transistor ofthe circuit responsive to an edge of an input signal, the drivertransistor coupled between the first power node and the output node. Afeedback signal is generated based on a slew rate of a signal at theoutput node of the circuit, and a contending circuit is caused tocontend with the driver transistor by electrically coupling a drain ofthe driver transistor with a second power node through the contendingcircuit responsive to the feedback signal.

Various types of transistors are discussed in this disclosure asexample. In some embodiments, the implementations using other types oftransistors different from those illustrated in the present disclosureare within the scope of the subject application.

The foregoing outlines features of several embodiments so that thoseskilled in the art may better understand the aspects of the presentdisclosure. Those skilled in the art should appreciate that they mayreadily use the present disclosure as a basis for designing or modifyingother processes and structures for carrying out the same purposes and/orachieving the same advantages of the embodiments introduced herein.Those skilled in the art should also realize that such equivalentconstructions do not depart from the spirit and scope of the presentdisclosure, and that they may make various changes, substitutions, andalterations herein without departing from the spirit and scope of thepresent disclosure.

What is claimed is:
 1. A circuit comprising: a first power nodeconfigured to carry a first voltage having a first voltage level; anoutput node; a driver transistor coupled between the first power nodeand the output node, the driver transistor being configured to be turnedon responsive to an edge of a first type of an input signal and to beturned off responsive to an edge of a second type of the input signal,the driver transistor having a source, a drain, and a gate, the sourceof the driver transistor being coupled with the first power node; and acontending circuit comprising: a slew rate detection circuit configuredto generate a feedback signal based on a signal at the output node; anda contending transistor between the drain of the driver transistor and asecond voltage, the contending transistor having a gate configured toreceive a control signal based on the feedback signal, and the secondvoltage having a second voltage level, the second voltage level beingless than the first voltage level if the signal at the output node risesresponsive to the edge of the first type of the input signal, and thesecond voltage level being greater than the first voltage level if thesignal at the output node falls responsive to the edge of the first typeof the input signal.
 2. The circuit of claim 1, wherein the contendingtransistor has a driving capability equal to or less than a drivingcapability of the driver transistor.
 3. The circuit of claim 1, whereinthe contending transistor is one type of an N-type transistor or aP-type transistor and the driver transistor is the other type of theN-type transistor or the P-type transistor.
 4. The circuit of claim 1,wherein the driver transistor is configured to be turned on and offresponsive to the input signal having a voltage level ranging from azero reference level to a predetermined voltage level greater than thezero reference level; and the contending transistor is configured tocontrol a voltage at the drain of the driver transistor to have a valuethat differs from a value of the signal at the output node by an amountless than or equal to a difference between the predetermined voltagelevel and the zero reference level.
 5. The circuit of claim 1, whereinthe driver transistor is configured to be turned on and off responsiveto the input signal having a voltage level ranging from a zero referencelevel to a predetermined voltage level greater than the zero referencelevel; and an absolute value of a voltage difference between the firstvoltage level and the second voltage level is no greater than adifference between the predetermined voltage level and the zeroreference level.
 6. The circuit of claim 5, further comprising aplurality of additional driver transistors coupled between the drivertransistor and the output node, wherein the circuit is configured tooutput the signal at the output node having a voltage level ranging fromthe zero reference level to the first voltage level, and the firstvoltage level is a multiple of the predetermined voltage level, themultiple being a total of the driver transistor plus a number ofadditional driver transistors of the plurality of additional drivertransistors.
 7. The circuit of claim 1, wherein the contending circuitfurther comprises a control circuit configured to generate the controlsignal based on a signal at the gate of the driver transistor, thecontrol circuit comprising an adjustable delay circuit responsive to thefeedback signal.
 8. The circuit of claim 7, wherein the control circuitfurther comprises a logic gate configured to receive the signal at thegate of the driver transistor and an output of the adjustable delaycircuit, and to output the control signal.
 9. The circuit of claim 7,wherein the control circuit is configured to generate the control signalhaving a timing that causes the driver transistor and the contentiontransistor to be turned off simultaneously.
 10. The circuit of claim 7,wherein the adjustable delay circuit is configured to have a delay thatincreases as a slew rate of the signal at the output node decreases. 11.A circuit comprising: a first power node configured to carry a firstpower voltage; a second power node configured to carry a second powervoltage; an output node configured to carry an output voltage; a drivertransistor coupled between the output node and either the first powernode or the second power node, the driver transistor comprising asource, a drain, and a gate, the drain being coupled with the outputnode; a biasing circuit configured to control the driver transistorbased on an input signal having a voltage level ranging from a zeroreference level to a predetermined voltage level greater than the zeroreference level; and a contending circuit configured to control avoltage at the source of the driver transistor, wherein a magnitude of adifference between the output voltage and the voltage at the source ofthe driver transistor is controlled to be less than or equal to thepredetermined voltage level.
 12. The circuit of claim 11, wherein thecontending circuit comprises a contending transistor configured tocouple the source of the driver transistor to the predetermined voltagelevel.
 13. The circuit of claim 11, wherein the driver transistor is afirst driver transistor coupled between the output node and the firstpower node, the circuit further comprising: a second driver transistorcoupled between the output node and the second power node; and a secondcontending circuit configured to control a voltage at the source of thesecond driver transistor, wherein a magnitude of a difference betweenthe output voltage and the voltage at the source of the second drivertransistor is controlled to be less than or equal to the predeterminedvoltage level.
 14. The circuit of claim 13, wherein the contendingcircuit comprises a contending transistor configured to couple thesource of the driver transistor to the predetermined voltage level, andthe second contending circuit comprises a second contending transistorconfigured to couple the source of the second driver transistor to thepredetermined voltage level.
 15. The circuit of claim 13, furthercomprising a slew rate detection circuit configured to generate afeedback signal based on a slew rate of the output voltage, wherein thecontending circuit is configured to couple the source of the drivertransistor to the predetermined voltage level based on the feedbacksignal, and the second contending circuit is configured to couple thesource of the second driver transistor to the predetermined voltagelevel based on the feedback signal.
 16. A method comprising:electrically coupling an output node of a circuit with a first powernode through a driver transistor of the circuit responsive to an edge ofan input signal, the driver transistor coupled between the first powernode and the output node; generating a feedback signal based on a slewrate of a signal at the output node of the circuit; and causing acontending circuit to contend with the driver transistor by electricallycoupling a drain of the driver transistor with a second power nodethrough the contending circuit responsive to the feedback signal. 17.The method of claim 16, wherein the input signal has a voltage levelranging from a zero reference level to a predetermined voltage levelgreater than the zero reference level, and the causing the contendingcircuit to contend with the driver transistor comprises controlling avoltage at the drain of the driver transistor to have a value thatdiffers from a value of the signal at the output node by an amount lessthan or equal to a difference between the predetermined voltage leveland the zero reference level.
 18. The method of claim 16, furthercomprising causing a second contending circuit to contend with a seconddriver transistor by electrically coupling a drain of the second drivertransistor with a third power node through the second contending circuitresponsive to a second feedback signal.
 19. The method of claim 18,wherein the second power node and the third power node have a samevoltage level.
 20. The method of claim 16, wherein the causing thecontending circuit to contend with the driver transistor comprises:controlling a contending transistor with an adjustable delay circuit;and controlling a delay of the adjustable delay circuit responsive tothe feedback signal.